An Introduction to Statistical Process Control (SPC)

One of the key ideas in lean manufacturing is that defects should be detected as early as possible. Efforts to control manufacturing processes so that issues can be detected before defects occur actually predate lean. Statistical Process Control (SPC) is a set of methods first created by Walter A. Shewhart at Bell Laboratories in the early 1920’s. W. Edwards Deming standardized SPC for the American industry during WWII and introduced it to Japan during the American occupation after the war…


Source URL: An Introduction to Statistical Process Control (SPC)

Source Website: Advance Engineering – Engineering.com

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